Yaakov Bar-Shalom (S'63-M'66-SM'80-F'84) received the B.S. and M.S. degrees from the Technion, Israel Institute of Technology, in 1963 and 1967 and the Ph.D. degree from Princeton University in 1970, all in electrical engineering. Currently, he is Board of Trustees Distinguished Professor in the Dept. of Electrical and Computer Engineering and Director of the ESP (Estimation and Signal Processing) Lab at the University of Connecticut. His current research interests are in estimation theory and target tracking, and he has published over 300 papers and book chapters in these areas and in stochastic adaptive control. He co-authored Tracking and Data Association, Estimation and Tracking: Principles, Techniques and Software, Estimation with Applications to Tracking and Navigation: Algorithms and Software for Information Extraction, Multitarget-Multisensor Tracking: Principles and Techniques, and edited Multitarget-Multisensor Tracking: Applications and Advances, Volumes I, II and III. He was elected Fellow of the IEEE for "contributions to the theory of stochastic systems and of multi-target tracking", and has consulted to numerous companies and government agencies, and originated the series of Multitarget-Multisensor Tracking short courses offered via UCLA Extension, at Government Laboratories, private companies and overseas. Since 1995, he is a Distinguished Lecturer of the IEEE AESS and has given several keynote addresses at major national and international conferences. He is a co-recipient of the M. Barry Carlton Award for the best paper in the IEEE Transactions on Aerospace and Electronic Systems in 1995 and 2000.
AESS Distinguished Lecturer (2017-2019); IEEE Fellow
University of Connecticut
Technical Areas of Interest:
Target Tracking Systems; Information extraction and fusion from remote sensors (radar, sonar, electrooptical) for tracking cooperative or noncooperative targets by estimating their trajectories in the presence of disturbances like measurement errors, target maneuvers and interfering signals (false measurements or from detections from other targets).